An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

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An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determi...

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Calibration of rectangular atomic force microscope cantilevers

A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid ~typically air!, and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. @Rev. Sci. Instrum. 66, 3...

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Spring constant calibration of atomic force microscope cantilevers of arbitrary shape.

The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function...

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Normal and torsional spring constants of atomic force microscope cantilevers

Two methods commonly used to measure the normal spring constants of atomic force microscope cantilevers are the added mass method of Cleveland et al. @J. P. Cleveland et al., Rev. Sci. Instrum. 64, 403 ~1993!#, and the unloaded resonance technique of Sader et al. @J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 ~1999!#. The added mass method involves measuring the chang...

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Calibration of atomic force microscope cantilevers using piezolevers.

The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but it can also provide quantitative information when calibrated cantilevers are used. In this article a new technique is demonstrated to calibrate AFM cantilevers using a reference piezolever. Experiments are performed on 13 different commercially available cantilevers. The stiff cantilevers, whose...

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ژورنال

عنوان ژورنال: Scientific Reports

سال: 2015

ISSN: 2045-2322

DOI: 10.1038/srep15828